• Skip to primary navigation
  • Skip to main content
  • Skip to footer

Vonoff

SkyKo Comics and videos about Semiconductor and nanotechnology | 반도체 만화

  • HOME
  • COMICS & VIDEOS
  • ABOUT
  • CONTACT
Home / Archives for AFM

AFM

The Emergency – SC1 wet chemical clean induced yield drop

February 2, 2017 By sky Leave a Comment

Summary Al contaminants introduced from the SC-1 solution are responsible for the threshold voltage shift and GOI degradation after thermal treatment. … [Read more...] about The Emergency – SC1 wet chemical clean induced yield drop

Filed Under: Comics, Nanotechnology Tagged With: AFM, aluminum contamination, GOI, SC1, wet chemical clean, yield

Footer

  • skyonsky@gmail.com
  • About
  • Comics

All work © Sky Ko -