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Home / Archives for implantation

implantation

Ion beam angle uniformity wafer mapping using TW V-curves: Ep2

October 11, 2018 By sky Leave a Comment

Summary High resolution micro-uniformity map of ion beam angle is valuable to monitor beam quality control performance of an ion implanter. It provides details … [Read more...] about Ion beam angle uniformity wafer mapping using TW V-curves: Ep2

Filed Under: Beam angle control, Comics, Implantation, Measurement & Characterization, Nanotechnology Tagged With: beam angle control, beam angle measurement, implantation, Thermal Wave, V-curve

How to monitor plasma ion implantation process for fault detection?

August 29, 2018 By sky Leave a Comment

Summary How to ensure the dose accuracy of the plasma doping or PIII system. What algorithm does the dose controller use to integrate Faraday currents?. How to … [Read more...] about How to monitor plasma ion implantation process for fault detection?

Filed Under: Comics, Implantation, Nanotechnology, Plasma ion implantation Tagged With: high speed data acquisition, implantation, plasma doping, plasma doping dosimetry, plasma process monitoing

Dose accuracy in plasma doping

August 19, 2018 By sky Leave a Comment

Summary Unlike Beamline, accurate dose measurement is a big challenge for plasma immersion doping. The simple integration of the faraday current can't accurately … [Read more...] about Dose accuracy in plasma doping

Filed Under: Comics, Implantation, Nanotechnology, Plasma ion implantation Tagged With: implantation, plasma doping, plasma doping dosimetry

Mapping wafer temperature spatial distribution

February 1, 2017 By sky Leave a Comment

Summary A custom-made probe wafer with RTD sensor provides wafer temperature spatial distribution map by measuring transient temperature distribution in a … [Read more...] about Mapping wafer temperature spatial distribution

Filed Under: Comics, Hot and Cold implant, Implantation, Nanotechnology Tagged With: avizo software, cold implant, hot implant, implantation, in-situ process monitoring, probe wafer, spatial distribution, wafer temperature

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